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For citations:

Yarmolik V.N., Levantsevich V.A., Demenkovets D.V., Mrozek I. Construction and application of march tests for pattern sensitive memory faults detection. Informatics. 2021;18(1):25-42. (In Russ.) https://doi.org/10.37661/1816-0301-2021-18-1-25-42

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This work is licensed under a Creative Commons Attribution 4.0 License.


ISSN 1816-0301 (Print)
ISSN 2617-6963 (Online)

220012, Minsk, Surganov Str 6.
The United Institute of Informatics Problems
of the National Academy of Sciences of Belarus
(UIIP NASB)
e-mail: rio@newman.bas-net.by

supported by NEICON (Elpub lab)