PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1
Abstract
Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-exhaustive test based on multiple memory tests with a variable background is reduced to the combinatorial task of the coupon collector. Estimates of the mean, minimum, and maximum multiplicity of a multiple test are given to provide an exhaustive set of combinations for a given number of cells of a memory device. The validity of analytical estimates is shown experimentally and the possibility of pseudo-exhaustive memory testing is confirmed.
About the Authors
V. N. Yarmolik
Belarusian State University of Computer Science and Electronic Engineering,
Minsk
Belarus
D. Sc. (Engineering), Professor
Belarus
D. Sc. (Engineering), Professor
I. Mrozek
Politechnika Białostocka, Białystok
Poland
Ph. D., Lecture
Poland
Ph. D., Lecture
B. A. Levantsevich
Belarusian State University of Computer Science and Electronic Engineering,
Minsk
Belarus
Master of Engineering, Assistant
Belarus
Master of Engineering, Assistant
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Review
For citations:
Yarmolik V.N., Mrozek I., Levantsevich B.A. PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1. Informatics. 2018;15(1):110-121. (In Russ.)
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