PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1

V. N. Yarmolik; I. Mrozek; B. A. Levantsevich

PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1

V. N. Yarmolik, I. Mrozek, B. A. Levantsevich

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Abstract

Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-exhaustive test based on multiple memory tests with a variable background is reduced to the combinatorial task of the coupon collector. Estimates of the mean, minimum, and maximum multiplicity of a multiple test are given to provide an exhaustive set of combinations for a given number of cells of a memory device. The validity of analytical estimates is shown experimentally and the possibility of pseudo-exhaustive memory testing is confirmed.

Keywords

march tests, pseudo-exhaustive tests, coupon collector problem

References

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For citations:

Yarmolik V.N., Mrozek I., Levantsevich B.A. PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1. Informatics. 2018;15(1):110-121. (In Russ.)

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ISSN 1816-0301 (Print)
ISSN 2617-6963 (Online)

Informatics

PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1

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Informatics

PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1

Full Text:

Abstract

Keywords

About the Authors

References

Review

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