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For citations:

Yarmolik V.N., Demenkovets D.V., Petrovskaya V.V., Ivaniuk A.A. Formal description model and conditions for detecting linked coupling faults of the memory devices. Informatics. 2023;20(4):7-23. (In Russ.) https://doi.org/10.37661/1816-0301-2023-20-4-7-23

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This work is licensed under a Creative Commons Attribution 4.0 License.


ISSN 1816-0301 (Print)
ISSN 2617-6963 (Online)

220012, Minsk, Surganov Str 6.
The United Institute of Informatics Problems
of the National Academy of Sciences of Belarus
(UIIP NASB)
e-mail: rio@newman.bas-net.by

supported by NEICON (Elpub lab)