Logical gates recognition in a flat transistor circuit
https://doi.org/10.37661/1816-0301-2021-18-4-96-107
Abstract
O b j e c t i v e s. With the increasing complexity of verification and simulation of modern VLSI, containing hundreds of millions of transistors, the means of extracting the hierarchical description at the level of logical elements from
a flat description of circuits at the transistor level are becoming the main tools for computer-aided design and verification. Decompilation tools for transistor circuits can not only significantly reduce the time to perform VLSI topology check, but also provide the basis for generating test cases, logical reengineering of integrated circuits and reverse engineering to detect untrusted attachments.
The objective of the work is to solve the problem of extracting the structure of the functional level from a flat circuit of the transistor level by recognizing in it subcircuits that implement logical elements.
M e t h o d s. Graph based methods are proposed for solving some key problems arising at the stage of structural recognition of CMOS gates in a transistor circuit: partitioning a graph into connectivity components corresponding to transistor subcircuits; recognition of subcircuits that are logical elements, and functions implemented by them; forming a library of recognized gates and constructing two-level transistor circuit. The original flat and resulting two-level transistor circuits are presented in SPICE format.
Re s u l t s. The proposed methods are implemented in C++ as a part of a transistor circuit decompilation program
for the case without any predetermined cell library. All steps of the proposed methods of structural CMOS gates recognition are performed in a linear time from the number of transistors in the initial circuit.
Co n c l u s i o n. The decompilation program has been tested on practical transistor-level circuits. Experiments indicate that the present tool is fast enough to process circuits with more than a hundred thousand transistors in a few minutes on a personal computer. Currently, the authors are developing methods for recognizing more complex elements in a transistor circuit, such as memory elements.
About the Authors
D. I. CheremisinovBelarus
Dmitry I. Cheremisinov - Cand. Sci. (Eng.), Associate Professor, Leading Researcher, The United Institute of Informatics Problems of the National Academy of Sciences of Belarus.
Surganova st., 6, Minsk, 220012.
L. D. Cheremisinova
Belarus
Ljudmila D. Cheremisinova - Dr. Sci. (Eng.), Professor, Chief Researcher, The United Institute of Informatics Problems of the National Academy of Sciences of Belarus.
Surganova st., 6, Minsk, 220012.
References
1. Cheremisinov D. I., Cheremisinova L. D. Extracting a logic gate network from a transistor-level CMOS circuit. Russian Microelectronics, 2019, vol. 48, no. 3, рр. 187–196. https://doi.org/10.1134/S0544126919030037
2. Abadir M. S., Ferguson J. An improved layout verification algorithm (LAVA). Proceedings of the European Design Automation Conference (EURO-DAC'90), Glasgow, UK, 12–15 March 1990. Glasgow, 1990, рр. 391–395.
3. Kundu S. GateMaker: A transistor to gate level model extractor for simulation, automatic test pattern generation and verification. Proceedings of the International Test Conference, Washington, DC, USA, 18–23 October 1998. Washington, 1998, рр. 372–381.
4. Hunt V. D. Reengineering: Leveraging the Power of Integrated Product Development. Wiley, 1993, 283 p.
5. Seok M. G., Park D. J., Cho G. R., Kim T. G. Framework for simulation of the Verilog/SPICE mixed model: Interoperation of Verilog and SPICE simulators using HLA/RTI for model reusability. 22nd International Conference on Very Large Scale Integration (VLSI-SoC), Playa del Garmen, Mexico, 6–8 October 2014. Playa del Garmen, 2014, рр. 1–6.
6. Belous A. I., Solodukha V. A. Osnovy kiberbezopasnosti. Standarty, kontseptsii, metody i sredstva obespecheniya. Fundamentals of Cybersecurity. Standards, Concepts, Methods and Means of Support. Moscow, Tekhnosfera, 2021, 482 p. (In Russ.).
7. Zhang T., Wang L. A comprehensive FPGA reverse engineering tool-chain: From bitstream to RTL code. IEEE Access, 2019, vol. 7, рр. 38379–38389. https://doi.org/10.1109/ACCESS.2019.2901949
8. Rabaev J. M., Chandrakasan A., Nikolic B. Digital Integrated Circuits. Prentice Hall Press, 2008, 702 p.
9. Bushnell M., Agrawal V. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI. Springer Science & Business Media, 2006, 690 p.
10. Cheremisinova L. D. Sintez i optimizatsiya kombinatsionnykh struktur SBIS. Synthesis and Optimization of Combinational Structures of VLSI. Мinsk, Ob''edinennyj institut problem informatiki Nacional'noj akademii nauk Belarusi, 2005, 235 p. (In Russ.).
Review
For citations:
Cheremisinov D.I., Cheremisinova L.D. Logical gates recognition in a flat transistor circuit. Informatics. 2021;18(4):96-107. (In Russ.) https://doi.org/10.37661/1816-0301-2021-18-4-96-107