PSEUDOEXHAUSTIVE RAM TESTING
Abstract
Modern RAM tests and methods for their generation are analyzed and investigated. The wide application of pseudoexhaustive tests as the main test procedure for modern computer systems has been proved. The main estimates and metrics for so kind of tests are obtained. The values of analytical estimates have been validated by the experimental investigations.
About the Authors
V. N. Yarmolik
Белорусский государственный университет информатики и радиоэлектроники
Belarus
Belarus
I. Mrozek
Белостокский технический университет
Poland
Poland
B. A. Levantsevich
Белорусский государственный университет информатики и радиоэлектроники
Russian Federation
Russian Federation
References
1. An Orchestrated Survey on Automated Software Test Case Generation / S. Anand [et al.] ;A. Bertolino, J. Jenny, L. Zhu, H. Zhu (ed.) // Journal of Systems and Software. – 2014. – Vol. C–39,no. 4. – P. 582–586.
2. Barzilai, Z. Exhaustive Generation of Bit Pattern with Application to VLSI Self–Testing /Z. Barzilai, D. Coppersmith, A. Rozenberg // IEEE Transactions on Computers. – 1983. – Vol. C–31,no. 2. – P. 190–194.
3. Malaiya, Y.K. The coverage problem for random testing / Y.K. Malaiya, S. Yang // In Proc.of Intern. Test Conference (ITC 1984). – Philadelphia, PA, USA, 1984. – P. 237–242.
4. Ярмолик, С.В. Управляемые вероятностные тесты / С.В. Ярмолик, В.Н. Ярмолик //Автоматика и телемеханика. – 2012. – № 10. – C. 142–155.
5. Furuya, K. A probabilistic approach to locally exhaustive testing / K. Furuya // IEEE Transactions on IEICE. – 1989. – Vol. E72, no. 5. – P. 656–660.
6. Mrozek, I. Iterative Antirandom Testing / I. Mrozek, V. Yarmolik // Journal of Electronic Testing: Theory and Applications (JETTA). – 2012. – Vol. 9, no. 3. – P. 251–266.
7. Ярмолик, С.В. Управляемое случайное тестирование / С.В. Ярмолик, В.Н. Ярмолик //Информатика. – 2011. – № 1(29). – C. 79–88.
8. Ярмолик, С.В. Квазислучайное тестирование вычислительных систем / С.В. Ярмолик,В.Н. Ярмолик // Информатика. – 2013. – № 3(39). – С. 92–103.
9. Mrozek, I. Multiple Controlled Random Testing / I. Mrozek, V. Yarmolik // Fundamenta Informaticae. – 2016. – Vol. 144, no. 1. – P. 23–43.
10. Das, D. Exhaustive and Near–Exhaustive Memory Testing Techniques and their BIST Implementations / D. Das, M.G. Karpovsky // Journal of Electronic Testing. − 1997. – Vol. 10. −P. 215−229.
11. Segall, I. Using binary decision diagrams for combinatorial test design / I. Segall, R. Tzoref-Brill, E. Farchi // Proc. of the Intern. Symp. on Software Testing and Analysis (ISSTA’11). – Toronto, Canada, 2011. − P. 254–264.
12. Yarmolik, S.V. The Syntheses of Probability Tests with a Small Number of Kits / S.V. Yarmolik, V.N. Yarmolik // Automatic Control and Computer Science. – 2011. − Vol. 45, no. 3. − P. 133−141.
13. Chen, T.Y. Quasi-Random Testing / T.Y. Chen, R. Merkel // IEEE Trans. on Reliability. − 2007. – Vol. 56, no. 3. – P. 562–568.
14. Ярмолик, C.В. Многократные неразрушающие маршевые тесты с изменяемыми адресными последовательностями / С.В. Ярмолик, В.Н. Ярмолик // Автоматика и телемеханика. –2007. – № 4. – С. 126–137.
15. Mrozek, I. Method for Generation Multiple Controlled Random Tests / I. Mrozek, V. Yarmolik // Proc. of the Computer Information Systems and Industrial Management (CISIM 2016). – Vilnius : Springer International Publisher, 2016. – P. 429–440.
16. Goor, A.J. Testing Semiconductor Memories, Theory and Practice / A.J. Goor. – Chichester, UK : John Wiley & Sons, 1991. – 536 p.
17. Niggemeyer, D. Integration of Non-classical Faults in Standard March Tests / D. Niggemeyer, M. Redeker, J. Otterstedt // Proc. of the IEEE Intern. Workshop on Memory Technology, Design and Testing (MTDT’98). – Washington, USA, 1998. – P. 91–98.
18. Choinski, T.C. Generation of Digit Reversed Address Sequences for Fast FourierTransforms /T.C. Choinski, T.T. Tylaska // IEEE Transactions on Computers. – 1991. – Vol. 40, no. 6. – P. 780–784.
19. Wang, W.L. A Complete Memory Address Generator for Scan Based March Algorithms /W.L. Wang, K.J. Lee // Proc. of the IEEE Intern. Workshop on Memory Technology, Design, and Testing (MTDT’05). – Taipei, Taiwan, 2005. – Р. 83–88.
20. Flajolet, P. Birthday paradox, coupon collectors, caching algorithms and self-organizing search / P. Flajolet, D. Gardy, L. Thimonier // Discrete Appl. Math. – 1992. – No. 39. – P. 207–229.
Review
For citations:
Yarmolik V.N., Mrozek I., Levantsevich B.A. PSEUDOEXHAUSTIVE RAM TESTING. Informatics. 2017;(2(54)):58-69. (In Russ.)
Views: 698
Email this article 