Pseudoexhaustive memory testing based on March A type march tests
https://doi.org/10.37661/1816-0301-2020-17-2-54-70
Abstract
The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necessary condition that test procedures must satisfy to deal complex faults, is substantiated. This condition is in the formation of a pseudo-exhaustive test for a given number of arbitrary memory cells. We study the effectiveness of single and double application of tests like MATS ++, March C– and March A, and also give its analytical estimates for a different number of k ≤ 10 memory cells participating in a malfunction. The applicability of the mathematical model of the combinatorial problem of the coupon collector for describing multiple memory testing is substantiated. The values of the average, minimum, and maximum multiplicity of multiple tests are presented to provide an exhaustive set of binary combinations for a given number of arbitrary memory cells. The validity of analytical estimates is experimentally shown and the high efficiency of the formation of a pseudo-exhaustive coverage by tests of the March A type is confirmed.
About the Authors
V. N. Yarmolik
Belarusian State University of Informatics and Radioelectronics
Belarus
Belarus
Vyacheslav N. Yarmolik, Dr. Sci. (Eng.), Professor
Minsk
I. Mrozek
Bialystok University of Technology
Poland
Poland
Ireneusz Mrozek, Dr., Lecture
Bialystok
S. V. Yarmolik
Belarusian State University of Informatics and Radioelectronics
Belarus
Belarus
Svetlana V. Yarmolik, Cand. Sci. (Eng.)
Minsk
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Review
For citations:
Yarmolik V.N., Mrozek I., Yarmolik S.V. Pseudoexhaustive memory testing based on March A type march tests. Informatics. 2020;17(2):54-70. (In Russ.) https://doi.org/10.37661/1816-0301-2020-17-2-54-70
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