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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">inform</journal-id><journal-title-group><journal-title xml:lang="ru">Информатика</journal-title><trans-title-group xml:lang="en"><trans-title>Informatics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1816-0301</issn><issn pub-type="epub">2617-6963</issn><publisher><publisher-name>UIIP NASB</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">inform-61</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>АВТОМАТИЗАЦИЯ ПРОЕКТИРОВАНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>COMPUTER AIDED DESIGN</subject></subj-group></article-categories><title-group><article-title>ОБЗОР МЕТОДОВ АКТИВНОЙ ИДЕНТИФИКАЦИИ ЦИФРОВЫХ УСТРОЙСТВ</article-title><trans-title-group xml:lang="en"><trans-title>ACTIVE METERING OF DIGITAL DEVICES: AN OVERVIEW</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Заливако</surname><given-names>С. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Zalivaka</surname><given-names>S. S.</given-names></name></name-alternatives><email xlink:type="simple">zalivako@bsuir.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванюк</surname><given-names>А. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Ivaniuk</surname><given-names>A. A.</given-names></name></name-alternatives><email xlink:type="simple">ivaniuk@bsuir.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Белорусский государственный университет информатики и радиоэлектроники</institution><country>Belarus</country></aff><pub-date pub-type="collection"><year>2016</year></pub-date><pub-date pub-type="epub"><day>30</day><month>09</month><year>2016</year></pub-date><volume>0</volume><issue>3</issue><fpage>38</fpage><lpage>48</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Заливако С.С., Иванюк А.А., 2016</copyright-statement><copyright-year>2016</copyright-year><copyright-holder xml:lang="ru">Заливако С.С., Иванюк А.А.</copyright-holder><copyright-holder xml:lang="en">Zalivaka S.S., Ivaniuk A.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://inf.grid.by/jour/article/view/61">https://inf.grid.by/jour/article/view/61</self-uri><abstract><p>Рассматриваются существующие методы активной идентификации цифровых устройств и приводится обоснование необходимости использования таких методов компаниями – проектировщиками интегральных схем. Представляется описание методов, основанных на модифицирующих преобразованиях цифрового конечного автомата и протоколах асимметричного шифрования. Анализируются преимущества и недостатки методов активной идентификации и предлагаются пути решения проблем, актуальных в настоящее время.</p></abstract><trans-abstract xml:lang="en"><p>The paper presents existing active hardware metering approaches. The motivation of using active metering approaches by fabless integrated circuits design companies is given. The finite state machine based and asymmetrical cryptography based methods are presented. The advantages and disadvantages of existing active metering approaches are analyzed. The potential solution for modern technique issues are proposed.</p></trans-abstract></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Wafer fabrication yield learning and cost analysis based on in-line inspection / I. 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