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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">inform</journal-id><journal-title-group><journal-title xml:lang="ru">Информатика</journal-title><trans-title-group xml:lang="en"><trans-title>Informatics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1816-0301</issn><issn pub-type="epub">2617-6963</issn><publisher><publisher-name>UIIP NASB</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">inform-383</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЛОГИЧЕСКОЕ ПРОЕКТИРОВАНИЕ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>LOGICAL DESIGN</subject></subj-group></article-categories><title-group><article-title>УПРАВЛЯЕМОЕ СЛУЧАЙНОЕ ТЕСТИРОВАНИЕ</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ярмолик</surname><given-names>С. В.</given-names></name></name-alternatives></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ярмолик</surname><given-names>В. Н.</given-names></name></name-alternatives><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Белорусский государственный университет информатики и радиоэлектроники</institution><country>Belarus</country></aff><pub-date pub-type="collection"><year>2011</year></pub-date><pub-date pub-type="epub"><day>23</day><month>04</month><year>2018</year></pub-date><volume>0</volume><issue>1(29)</issue><fpage>79</fpage><lpage>88</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ярмолик С.В., Ярмолик В.Н., 2018</copyright-statement><copyright-year>2018</copyright-year><copyright-holder xml:lang="ru">Ярмолик С.В., Ярмолик В.Н.</copyright-holder><copyright-holder xml:lang="en">Ярмолик С.В., Ярмолик В.Н.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://inf.grid.by/jour/article/view/383">https://inf.grid.by/jour/article/view/383</self-uri><abstract><p>Анализируются управляемые случайные тесты и методы их генерирования. Показываетсяобщность процедур генерирования тестовых векторов управляемых случайных тестов, использующих жадный оптимизационный алгоритм и метрики расстояния между тестовыми наборами. Предлагается метод построения оптимальных управляемых случайных тестов, характеризующихся максимальной полнотой покрытия в сравнении со случайными и управляемыми случайными тестами в силу максимального отличия тестовых наборов. Оптимальные управляемые случайные тесты характеризуются минимальной вычислительной сложностью их генерирования.</p></abstract></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Grindal, M. Combination Testing Strategies / M. Grindal, J. Offutt, S.F. Andler // GMU</mixed-citation><mixed-citation xml:lang="en">Grindal, M. Combination Testing Strategies / M. Grindal, J. Offutt, S.F. Andler // GMU</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Technical Report ISE-TR-04-05. – George Mason University, USA, 2004. – 32 p.</mixed-citation><mixed-citation xml:lang="en">Technical Report ISE-TR-04-05. – George Mason University, USA, 2004. – 32 p.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Malaiya, Y.K. The coverage problem for random testing / Y.K. Malaiya, S. Yang // Proc. of</mixed-citation><mixed-citation xml:lang="en">Malaiya, Y.K. The coverage problem for random testing / Y.K. Malaiya, S. Yang // Proc. of</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">ITC. – Las Vegas, USA, 1984. – P. 237–242.</mixed-citation><mixed-citation xml:lang="en">ITC. – Las Vegas, USA, 1984. – P. 237–242.</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Seth, S. A statistical theory of digital circuits testability / S. Seth, V. Agrawal, H. Farhat //</mixed-citation><mixed-citation xml:lang="en">Seth, S. A statistical theory of digital circuits testability / S. Seth, V. Agrawal, H. Farhat //</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">IEEE Transactions on Computers. – 1990. – Vol. C-39, № 4. – P. 582–586.</mixed-citation><mixed-citation xml:lang="en">IEEE Transactions on Computers. – 1990. – Vol. C-39, № 4. – P. 582–586.</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Malaiya, Y.K. An examination of fault exposure ratio / Y.K. Malaiya, A. Mayrhauser,</mixed-citation><mixed-citation xml:lang="en">Malaiya, Y.K. An examination of fault exposure ratio / Y.K. Malaiya, A. Mayrhauser,</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">P.K. Srimani // IEEE Transactions on Software Engineering. – 1993. – Vol. 19, № 11. – P. 1087–1094.</mixed-citation><mixed-citation xml:lang="en">P.K. Srimani // IEEE Transactions on Software Engineering. – 1993. – Vol. 19, № 11. – P. 1087–1094.</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Malaiya, Y.K. Antirandom Testing: Getting the most out of Back-Box Testing /</mixed-citation><mixed-citation xml:lang="en">Malaiya, Y.K. Antirandom Testing: Getting the most out of Back-Box Testing /</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">Y.K. Malaiya, S. Yang // Proc. of Sixth Intern. Symposium on Software Reliability Engineering. – Toulouse, France, 1995. – P. 86–95.</mixed-citation><mixed-citation xml:lang="en">Y.K. Malaiya, S. Yang // Proc. of Sixth Intern. Symposium on Software Reliability Engineering. – Toulouse, France, 1995. – P. 86–95.</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">Antirandom Testing: A Distance-Based Approach / S.H. Wu [et al.] // VLSI Design. – 2008. –</mixed-citation><mixed-citation xml:lang="en">Antirandom Testing: A Distance-Based Approach / S.H. Wu [et al.] // VLSI Design. – 2008. –</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">№ 2. – P. 1–9.</mixed-citation><mixed-citation xml:lang="en">№ 2. – P. 1–9.</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">Wu, S.Y. Antirandom vs. Pseudorandom Testing / S.H. Wu, Y.K. Malaiya, A.P. Jayasumana //</mixed-citation><mixed-citation xml:lang="en">Wu, S.Y. Antirandom vs. Pseudorandom Testing / S.H. Wu, Y.K. Malaiya, A.P. Jayasumana //</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">Proc. of IEEE Intern. Conf. on Computer Design (ICCD'98). – Austin, Texas, USA, 1998. – P. 221–223.</mixed-citation><mixed-citation xml:lang="en">Proc. of IEEE Intern. Conf. on Computer Design (ICCD'98). – Austin, Texas, USA, 1998. – P. 221–223.</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">Fast Antirandom (FAR) Test Generation / A. Mayrhause [et al.] // Proc. of the Third IEEE Intern. High-Assurance System Engineering Symposium. – Washington, D.C., USA, 1998. – P. 262–269.</mixed-citation><mixed-citation xml:lang="en">Fast Antirandom (FAR) Test Generation / A. Mayrhause [et al.] // Proc. of the Third IEEE Intern. High-Assurance System Engineering Symposium. – Washington, D.C., USA, 1998. – P. 262–269.</mixed-citation></citation-alternatives></ref><ref id="cit16"><label>16</label><citation-alternatives><mixed-citation xml:lang="ru">Chen, T.Y. Adaptive Random Testing / T.Y. Chen, H. Leung, I.K. Mak // Proc. of the 9th</mixed-citation><mixed-citation xml:lang="en">Chen, T.Y. Adaptive Random Testing / T.Y. Chen, H. Leung, I.K. Mak // Proc. of the 9th</mixed-citation></citation-alternatives></ref><ref id="cit17"><label>17</label><citation-alternatives><mixed-citation xml:lang="ru">Asian Computer Science Conf. (ASIAN 2004). – Chiang Mai, Thailand, 2004. – P. 320–329.</mixed-citation><mixed-citation xml:lang="en">Asian Computer Science Conf. (ASIAN 2004). – Chiang Mai, Thailand, 2004. – P. 320–329.</mixed-citation></citation-alternatives></ref><ref id="cit18"><label>18</label><citation-alternatives><mixed-citation xml:lang="ru">Zhou, Z.Q. Using Coverage Information to Guide Test Case Selection in Adaptive Random</mixed-citation><mixed-citation xml:lang="en">Zhou, Z.Q. Using Coverage Information to Guide Test Case Selection in Adaptive Random</mixed-citation></citation-alternatives></ref><ref id="cit19"><label>19</label><citation-alternatives><mixed-citation xml:lang="ru">Testing / Z.Q. Zhou // Proc. of the 34th IEEE Computer Software and Applications Conf. Workshops. – Seoul, South Korea, 2010. – P. 208–213.</mixed-citation><mixed-citation xml:lang="en">Testing / Z.Q. Zhou // Proc. of the 34th IEEE Computer Software and Applications Conf. Workshops. – Seoul, South Korea, 2010. – P. 208–213.</mixed-citation></citation-alternatives></ref><ref id="cit20"><label>20</label><citation-alternatives><mixed-citation xml:lang="ru">Adaptive Random Test Case Prioritization / B. Jiang [et al.] // Proc. of the IEEE/ACM Intern. Conf. on Automated Software Engineering. – Auckland, New Zealand, 2009. – P. 233–244.</mixed-citation><mixed-citation xml:lang="en">Adaptive Random Test Case Prioritization / B. Jiang [et al.] // Proc. of the IEEE/ACM Intern. Conf. on Automated Software Engineering. – Auckland, New Zealand, 2009. – P. 233–244.</mixed-citation></citation-alternatives></ref><ref id="cit21"><label>21</label><citation-alternatives><mixed-citation xml:lang="ru">Tappenden, A.F. A Novel Evolutionary Approach for Adaptive Random Testing / A.F. Tappenden, J. Miller // IEEE Transaction on reliability. – 2009. – Vol. 58, № 4. – P. 619–632.</mixed-citation><mixed-citation xml:lang="en">Tappenden, A.F. A Novel Evolutionary Approach for Adaptive Random Testing / A.F. Tappenden, J. Miller // IEEE Transaction on reliability. – 2009. – Vol. 58, № 4. – P. 619–632.</mixed-citation></citation-alternatives></ref><ref id="cit22"><label>22</label><citation-alternatives><mixed-citation xml:lang="ru">Chan, K.P. Good Random Testing / K.P. Chan, T.Y. Chen, D. Towey // Proc. of the 9th Ada-</mixed-citation><mixed-citation xml:lang="en">Chan, K.P. Good Random Testing / K.P. Chan, T.Y. Chen, D. Towey // Proc. of the 9th Ada-</mixed-citation></citation-alternatives></ref><ref id="cit23"><label>23</label><citation-alternatives><mixed-citation xml:lang="ru">Europe Intern. Conf. on Reliable Software Technologies (LNCS). – Palma de Mallorca, Spain, 2004. – P. 200–212.</mixed-citation><mixed-citation xml:lang="en">Europe Intern. Conf. on Reliable Software Technologies (LNCS). – Palma de Mallorca, Spain, 2004. – P. 200–212.</mixed-citation></citation-alternatives></ref><ref id="cit24"><label>24</label><citation-alternatives><mixed-citation xml:lang="ru">Chan, K.P. Normalized Restricted Random Testing / K.P. Chan, T.Y. Chen, D. Towey //</mixed-citation><mixed-citation xml:lang="en">Chan, K.P. Normalized Restricted Random Testing / K.P. Chan, T.Y. Chen, D. Towey //</mixed-citation></citation-alternatives></ref><ref id="cit25"><label>25</label><citation-alternatives><mixed-citation xml:lang="ru">Proc. of the 8th Ada-Europe Intern. Conf. on Reliable Software Technologies (LNCS). – Toulouse, France, 2003. – P. 368–381.</mixed-citation><mixed-citation xml:lang="en">Proc. of the 8th Ada-Europe Intern. Conf. on Reliable Software Technologies (LNCS). – Toulouse, France, 2003. – P. 368–381.</mixed-citation></citation-alternatives></ref><ref id="cit26"><label>26</label><citation-alternatives><mixed-citation xml:lang="ru">Chan, K.P. Restricted Random Testing / K.P. Chan, T.Y. Chen, D. Towey // Proc. of the</mixed-citation><mixed-citation xml:lang="en">Chan, K.P. Restricted Random Testing / K.P. Chan, T.Y. Chen, D. Towey // Proc. of the</mixed-citation></citation-alternatives></ref><ref id="cit27"><label>27</label><citation-alternatives><mixed-citation xml:lang="ru">th European Conf. on Software Quality. – Helsinki, Finland, 2002. – P. 321–330.</mixed-citation><mixed-citation xml:lang="en">th European Conf. on Software Quality. – Helsinki, Finland, 2002. – P. 321–330.</mixed-citation></citation-alternatives></ref><ref id="cit28"><label>28</label><citation-alternatives><mixed-citation xml:lang="ru">Kuo, F.C. An in-depth study of mirror adaptive random testing / F.C. Kuo // Proc. of the 14th European Conf. on Software Quality. – Kaiserslautern, Germany, 2009. – P. 51–58.</mixed-citation><mixed-citation xml:lang="en">Kuo, F.C. An in-depth study of mirror adaptive random testing / F.C. Kuo // Proc. of the 14th European Conf. on Software Quality. – Kaiserslautern, Germany, 2009. – P. 51–58.</mixed-citation></citation-alternatives></ref><ref id="cit29"><label>29</label><citation-alternatives><mixed-citation xml:lang="ru">Shiyi, Xu. Orderly Random Testing for Both Hardware and Software / Xu Shiyi // Proc. of Pacific Rim Intern. Symposium on Dependable Computing. – Gold Coast, Australia, 2008. – P. 160–167.</mixed-citation><mixed-citation xml:lang="en">Shiyi, Xu. Orderly Random Testing for Both Hardware and Software / Xu Shiyi // Proc. of Pacific Rim Intern. Symposium on Dependable Computing. – Gold Coast, Australia, 2008. – P. 160–167.</mixed-citation></citation-alternatives></ref><ref id="cit30"><label>30</label><citation-alternatives><mixed-citation xml:lang="ru">Shiyi, Xu. Maximum Distance Testing / Xu Shiyi, Chen Jianwen // Proc. of the 11-th IEEE</mixed-citation><mixed-citation xml:lang="en">Shiyi, Xu. Maximum Distance Testing / Xu Shiyi, Chen Jianwen // Proc. of the 11-th IEEE</mixed-citation></citation-alternatives></ref><ref id="cit31"><label>31</label><citation-alternatives><mixed-citation xml:lang="ru">Asian Test Symposium (ATS’02). – Los Alamitos, CA, USA, 2002. – P. 15–20.</mixed-citation><mixed-citation xml:lang="en">Asian Test Symposium (ATS’02). – Los Alamitos, CA, USA, 2002. – P. 15–20.</mixed-citation></citation-alternatives></ref><ref id="cit32"><label>32</label><citation-alternatives><mixed-citation xml:lang="ru">Hamming, W.R. Error Detecting and Error Correcting Codes / W.R. Hamming // Bell System Tech. Journal. – 1950. – Vol. 26, № 2. – P. 147–160.</mixed-citation><mixed-citation xml:lang="en">Hamming, W.R. Error Detecting and Error Correcting Codes / W.R. Hamming // Bell System Tech. Journal. – 1950. – Vol. 26, № 2. – P. 147–160.</mixed-citation></citation-alternatives></ref><ref id="cit33"><label>33</label><citation-alternatives><mixed-citation xml:lang="ru">Das, D. Exhaustive and Near–Exhaustive Memory Testing Techniques and their BIST Implementations / D. Das, M.G. Karpovsky // Journal of Electronic Testing: Theory and Applications. – 1997. – Vol. 10. – P. 215–229.</mixed-citation><mixed-citation xml:lang="en">Das, D. Exhaustive and Near–Exhaustive Memory Testing Techniques and their BIST Implementations / D. Das, M.G. Karpovsky // Journal of Electronic Testing: Theory and Applications. – 1997. – Vol. 10. – P. 215–229.</mixed-citation></citation-alternatives></ref><ref id="cit34"><label>34</label><citation-alternatives><mixed-citation xml:lang="ru">Knuth, D.E. The Art of Computer Programming. Vol. 3: Sorting and Searching. /</mixed-citation><mixed-citation xml:lang="en">Knuth, D.E. The Art of Computer Programming. Vol. 3: Sorting and Searching. /</mixed-citation></citation-alternatives></ref><ref id="cit35"><label>35</label><citation-alternatives><mixed-citation xml:lang="ru">D.E. Knuth. – 2nd ed. – Massachusetts : Addison-Wesley, 1998. – 730 p.</mixed-citation><mixed-citation xml:lang="en">D.E. Knuth. – 2nd ed. – Massachusetts : Addison-Wesley, 1998. – 730 p.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
